55 CLC/TC LUMINAIRES AND ASSOCIATED EQUIPMENT EN 60598-1:2015/prA1 (fragment 1):2016 Luminaires - Part 1: General requirements and tests Fecha Límite: 2016-09-02 EN 61347-1:2015/prA1:2016 Lamp controlgear - Part 1: General and safety requirements Fecha Límite: 2016-11-25 EN 61347-2-11:2001/prA1:2016 Lamp controlgear - Part 2-11: Particular requirements for miscellaneous electronic circuits used with luminaires Fecha Límite: 2016-11-25 CLC/TC PRIMARY CELLS AND BATTERIES FprEN 62281:2016 Safety of primary and secondary lithium cells and batteries during transport Fecha Límite: 2016-11-04 CLC/TC SPECIFIC COMPONENTS FOR SURGE ARRESTERS AND SURGE PROTECTIVE DEVICES FprEN 61343-351:2016 Components for lowvoltage surge protective devices - Part 351: Performance requirements and test methods for telecommunications and signalling network surge isolation transformers (SIT) Fecha Límite: 2016-10-14 CLC/TC RESISTORS EN 140401-802:2007/FprA Detail specification: Fixed low power film SMD resistors - Rectangular - Stability classes 1; 2 Fecha Límite: 2016-12-16 EN 140401-803:2007/FprA Detail specification: Fixed low power film SMD resistors - Cylindrical - Stability classes 0,05; 0,1; 0,25; 0,5; 1; 2 Fecha Límite: 2016-12-16 CLC/TC RF AND MICROWAVE PASSIVE COMPONENTS prEN 60153-4:2016 Hollow metallic waveguides - Part 4: Relevant specifications for circular waveguides Fecha Límite: 2016-09-09 prEN 60154-4:2016 Relevant specifications for flanges for circular waveguides Fecha Límite: 2016-09-16 CLC/TC COMMUNICATION CABLES prEN 62783-1:2016 Twinax cables for digital communications - Part 1: Family specification Fecha Límite: 2016-12-16 prEN 62783-2:2016 Twinax cables for digital communications - Part 2: Cable for ethernet-over-twinax physical interfaces Fecha Límite: 2016-12-16 CLC/TC SEMICONDUCTOR DEVICES prEN 60749-3:2016 Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination Fecha Límite: 2016-09-09 prEN 60749-5:2016 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test Fecha Límite: 2016-11-25 prEN 60749-6:2016 Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature Fecha Límite: 2016-09-09 prEN 60749-9:2016 Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking Fecha Límite: 2016-09-16 prEN 60749-43:2016 Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans Fecha Límite: 2016-12-02 prEN 62880-1:2016 Semiconductor devices - Stress Migration Test Standard - Part 1 - Copper Stress Migration Test Standard Fecha Límite: 2016-09-02 CLC/TC INTEGRATED CIRCUITS FprEN 62228-2:2016 Integrated circuits - EMC Evaluation of transceivers - Part 2: LIN transceivers Fecha Límite: 2016-11-04 CLC/TC MECHANICAL STANDARDIZATION OF SEMICONDUCTOR DEVICES FprEN 60191-6-13:2016 Mechanical standardization of semiconductor devices - Part 6-13: Design guideline of open-top type sockets for Finepitch Ball Grid Array and Fine-pitch Land Grid Array (FBGA/ FLGA) Fecha Límite: 2016-09-09 CLC/TC MECHANICAL STRUCTURES FOR ELECTRONIC EQUIPMENT FprEN 61587-1:2016 Mechanical structures for electrical and electronic equipment - Tests for IEC 60917 and IEC 60297 series - Part 1: Environmental requirements, test set-up and safety aspects for cabinets, racks, subracks and chassis under indoor condition use and transportation Fecha Límite: 2016-11-04 CLC/TC MAGNETIC COMPONENTS AND FERRITE MATERIALS FprEN 60205:2016 Calculation of the effective parameters of magnetic piece parts Fecha Límite: 2016-11-04 FprEN 61332:2016 Soft ferrite material classification Fecha Límite: 2016-10-28
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